Electron MicroscopY

DESCRIPTION

Transmission Electron Microscopy (TEM) is the highest resolution imaging technique used in the fields of materials science and biology. TEM is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen.

Our experienced operators utilize the FEI Titan 80-300 V Scanning TEM (S/TEM), the next generation TEM.  It uses a narrow focused electron beam spot to scan the sample in a raster pattern over an area of interest. Our TEM has been widely used to observe features such as crystalline structures, grain boundaries, interfaces etc. TEM allows one to observe structural details as small as individual atoms at the highest possible resolution. TEM can be used to study the growth of thin film layers, their composition and defects.

The following material properties can be studied:

• Topography

• Morphology

• Crystallographic structure – Selective Areas Diffraction Pattern

  • • Symmetry information

    • Lattice parameter

    • Crystal defects

• Chemical composition

  • • Spatial variation – Mapping

    • Spot analysis

PUBLICATIONS

• https://doi.org/10.1063/1.4974964

FEATURES

FEI Titan 80-300 V S/TEM FEATURES:

• 1.34 angstrom resolution

• Alignments at: 80, 200, 300 kV

• EDS (Oxford X-Max TEM 100N TLE Windowless SDD 100 mm2)

• Scanning Transmission Electron Microscopy (STEM) with HAADF, DF4, DF2, BF detectors

• High Resolution STEM (HRSTEM)

• 2x2K digital camera (Gatan) with Digital Micrograph GM3 software

Ideal for Interfacial study:  Between film and the substrate or between films in multilayers.