Electron MicroscopY


ID: CGC21.013.00


An SEM produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.

We provide experienced operators utilizing the FEI Nova 230 NanoSEM  Scanning Electron Microscope (SEM).  This SEM is capable of producing enlarged images of a variety of specimens, achieving magnifications of over 500,000x providing ultra high resolution imaging in a digital format. This important and widely used analytical tool provides exceptional depth of field and minimal specimen preparation.

SEM coupled with an energy dispersive x-ray spectrometer (EDS) provides elemental composition mapping. The following material properties can be studied:




The Nova 230 NanoSEM produces enlarged images of various samples, achieving magnifications of over 500 000x, providing ultra-high resolution imaging in a digital format. The SEM works in two different vacuum modes. High vacuum mode and low vacuum mode. Low vacuum mode is primarily for observing charging materials. Features include:

Electron image signal detectors:

Resolution at optimum working distance: